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We have developed a new imaging system that enables real-time X-Z imaging simultaneous with traditional X-Y imaging. This is done by arranging a 90ยบ reflecting optic above the specimen within the field of view of the standard epi-fluorescence imaging system. We call this method PRISM, for Pathway Rotated Imaging for Sideways Microscopy. We use a freely positioned reflecting optic that can observe a wide variety of specimens, with standard imaging microscopes, integrating it with light sheet microscopy and atomic force microscopy.

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